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[IEEE . 2003 International Symposium on System-on-Chip - Tampere, Finland (19-21 Nov. 2003)] Proceedings. 2003 International Symposium on System-on-Chip (IEEE Cat. No.03EX748) - CTL based DFT solution to accelerate design to test development for system on chip devices
Talluto, S.
- 作者Talluto, S.
- 文件大小53.79KB
- 发表时间2003
- DOI10.1109/issoc.2003.1267713
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