[IEEE AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference - Anaheim, CA, USA (22-25 Sept. 2003)] Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. - Next generation COTS test systems
- 作者Neal, T.M.
- 文件大小538.43KB
- 发表时间2003
- DOI10.1109/autest.2003.1243567
- 页码134-138
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