[IEEE 3rd International Symposium on Image and Signal Processing and Analysis, 2003. ISPA 2003. - Rome, Italy (Sept. 18-20, 2003)] 3rd International Symposium on Image and Signal Processing and Analysis, 2003. ISPA 2003. Proceedings of the - Line scratches detection and restoration via light diffraction
Bruni, V.; Vitulano, D.; Kokaram, A.
- 作者Bruni, V.; Vitulano, D.; Kokaram, A.
- 卷第1卷
- 文件大小384.79KB
- 发表时间2003
- DOI10.1109/ispa.2003.1296858
- 页码5-10