Complete Micropipe Dissociation in 4H-SiC(03-38) Epitaxial Growth and its Impact on Reverse Characteristics of Schottky Barrier Diodes
Kimoto, Tsunenobu; Danno, Katsunori; Fujihira, Keiko; Shiomi, Hiromu; Matsunami, Hiroyuki
- 期刊名称Materials Science Forum
- 作者Kimoto, Tsunenobu; Danno, Katsunori; Fujihira, Keiko; Shiomi, Hiromu; Matsunami, Hiroyuki
- 电子ISSN1662-9752
- 文件大小280.57KB
- 发表时间2003
- DOI10.4028/www.scientific.net/MSF.433-436.197
- 页码197-200