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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - <title>Extension of traceable calibration for electronic distance measuring instruments beyond the length of the laboratory</title>

SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - Extension of traceable calibration for electronic distance measuring instruments beyond the length of the laboratory

Forde, Lucy C.; Howick, Eleanor F.; Decker, Jennifer E.; Brown, Nicholas
  • 作者Forde, Lucy C.; Howick, Eleanor F.; Decker, Jennifer E.; Brown, Nicholas
  • 卷第5190卷
  • 印刷ISSN0277-786X
  • 文件大小213.94KB
  • 发表时间2003
  • DOI10.1117/12.503649
  • 页码289-299
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