SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - Extension of traceable calibration for electronic distance measuring instruments beyond the length of the laboratory
Forde, Lucy C.; Howick, Eleanor F.; Decker, Jennifer E.; Brown, Nicholas
- 作者Forde, Lucy C.; Howick, Eleanor F.; Decker, Jennifer E.; Brown, Nicholas
- 卷第5190卷
- 印刷ISSN0277-786X
- 文件大小213.94KB
- 发表时间2003
- DOI10.1117/12.503649
- 页码289-299