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[AIP SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03 - Eindhoven (NETHERLANDS) (21-25 July 2003)] AIP Conference Proceedings - The Influences of Tip Scan and Tunneling Current by Adsorbing Kr on a Si (111)-7×7 Surface at Low Temperature

[AIP SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03 - Eindhoven (NETHERLANDS) (21-25 July 2003)] AIP Conference Proceedings - The Influences of Tip Scan and Tunneling Current by Adsorbing Kr on a Si (111)-7×7 Surface at Low Temperature

Li, Y. J.

作者Li, Y. J.
卷第696卷
文件大小483.26KB
发表时间2003
DOI10.1063/1.1639788
页码818-822

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