[IEEE International Symposium on Electromagnetic Compatibility - Boston, MA, USA (18-22 Aug. 2003)] 2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) - Improved aperture model for shielding prediction
- 作者Konefal, T.; Dawson, J.F.; Marvin, A.C.
- 卷第1卷
- 文件大小382.21KB
- 发表时间2003
- DOI10.1109/ISEMC.2003.1236589
- 页码187-192
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