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[IEEE IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Philadelphia, PA, USA (8-10 June 2003)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 - RF circuit design in reliability

[IEEE IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Philadelphia, PA, USA (8-10 June 2003)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 - RF circuit design in reliability

Enjun Xiao, ; Yuan, J.S.

作者Enjun Xiao, ; Yuan, J.S.
文件大小235.18KB
发表时间2003
DOI10.1109/RFIC.2003.1214012
页码575-578

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