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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Design and test of a 100MW X-band TE/sub 01/ window

[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Design and test of a 100MW X-band TE/sub 01/ window

Neilson, J.; Ives, L.; Tantawi, S.G.
  • 作者Neilson, J.; Ives, L.; Tantawi, S.G.
  • 卷第2卷
  • 文件大小78.32KB
  • 发表时间2003
  • DOI10.1109/pac.2003.1289626
  • 页码1125-1126
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