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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - <title>Recent advances in the development of phase-shifting liquid crystal interferometers for visible and near-IR applications</title>

SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Recent advances in the development of phase-shifting liquid crystal interferometers for visible and near-IR applications

Marshall, Kenneth L.; Klehn, Brett; Watson, Bryan; Griffin, DeVon W.; Duparre, Angela; Singh, Bhanwar
  • 作者Marshall, Kenneth L.; Klehn, Brett; Watson, Bryan; Griffin, DeVon W.; Duparre, Angela; Singh, Bhanwar
  • 卷第5188卷
  • 印刷ISSN0277-786X
  • 文件大小1662.37KB
  • 发表时间2003
  • DOI10.1117/12.506025
  • 页码48-60
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