The Application of Machine Vision to IC Surface Inspection
- 期刊名称Asian Journal on Quality
- 作者Chung, Yi‐Chan; Tsai, Chih‐Hung; Lin, Yu‐Tang
- 卷第4卷
- 期第2期
- 印刷ISSN1598-2688
- 文件大小621.34KB
- 发表时间2003-08-21
- DOI10.1108/15982688200300019
- 页码50-64
Electrostatic Theory of Metal WhiskersKarpov, V. G. · Physical Review Applied · 2014
SurfacePatrick, Christopher E.; Giustino, Feliciano · Physical Review Applied · 2014
-BN/Graphene HeterostructureBrey, Luis · Physical Review Applied · 2014
Superconducting MemristorsPeotta, Sebastiano; Di Ventra, Massimiliano · Physical Review Applied · 2014
Thin FilmsMoon, Eun Ju; Keavney, David J.; May, Steven J. · Physical Review Applied · 2014
Optomechanical Conversion by Mechanical TurbinesKnežević, Miloš; Warner, Mark · Physical Review Applied · 2014
SubstratesWen, Zhenchao; Sukegawa, Hiroaki; Kasai, Shinya; Inomata, Koichiro; Mitani, Seiji · Physical Review Applied · 2014
FilmsKumah, Divine P.; Malashevich, Andrei; Disa, Ankit S.; Arena, Dario A.; Walker, Frederick J.; Ismail-Beigi, Sohrab; Ahn, Charles H. · Physical Review Applied · 2014