SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Wavelets: Applications in Signal and Image Processing X - Multiscale detection of filamentary features in image data
Huo, Xiaoming; Unser, Michael A.; Aldroubi, Akram; Chen, Jihong; Donoho, David L.; Laine, Andrew F.
- 作者Huo, Xiaoming; Unser, Michael A.; Aldroubi, Akram; Chen, Jihong; Donoho, David L.; Laine, Andrew F.
- 卷第5207卷
- 印刷ISSN0277-786X
- 文件大小691.59KB
- 发表时间2003
- DOI10.1117/12.503721