Silver Nanoprisms and Nanotetrahedra Investigated by Transmission Electron Microscopy
- 期刊名称Microscopy and Microanalysis
- 作者Zheng, Jian-Guo
- 卷第9卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小610.01KB
- 发表时间2003-08
- DOI10.1017/s1431927603441962
- 页码392-393
Properties and Applications of New Silicon Drift Detectors and Multiple Element Silicon Drift DetectorsTerborg, Ralf; Rohde, Martin · Microscopy and Microanalysis · 2004
The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference MaterialAlvisi, Marco; Blome, Markus; Griepentrog, Michael; Hodoroaba, Vasile-Dan; Karduck, Peter; Mostert, Marco; Nacucchi, Michele; Procop, Mathias; Rohde, Martin; Scholze, Frank; Statham, Peter; Terborg, Ralf; Thiot, Jean-Francois · Microscopy and Microanalysis · 2006
Image analysis and simulation software in transmission electron microscopyStadelmann, P · Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada · 2003
Surface Microanalysis with Slow ElectronsBauer, Ernst G. · Microscopy and Microanalysis · 2006
Scientific ProgramMicroscopy and Microanalysis · 2008
Nanogenerators and NanopiezotronicsWang, ZL · Microscopy and Microanalysis · 2009
Trichomonads under MicroscopyBenchimol, Marlene · Microscopy and Microanalysis · 2004
Electron Microscopic Studies with GrapheneMeyer, J; Chuvilin, A; Kaiser, U · Microscopy and Microanalysis · 2009
Stress Whitening Morphology of Multiphase PolypropyleneWestphal, S · Microscopy and Microanalysis · 2006
Aberration-Corrected Lorentz MicroscopyNuhfer, NT; Budruk, A; De Graef, M · Microscopy and Microanalysis · 2010