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Structural characterization of silicon nanostructures by energy filtered transmission electron microscopy

Structural characterization of silicon nanostructures by energy filtered transmission electron microscopy

Boninelli, Simona; Iacona, Fabio; Bongiorno, Corrado; Franzò, Giorgia; Priolo, Francesco
  • 期刊名称Microscopy and Microanalysis
  • 作者Boninelli, Simona; Iacona, Fabio; Bongiorno, Corrado; Franzò, Giorgia; Priolo, Francesco
  • 卷第9卷
  • 印刷ISSN1431-9276
  • 电子ISSN1435-8115
  • 文件大小344.91KB
  • 发表时间2003-09
  • DOI10.1017/s1431927603022025
  • 页码206-207
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