Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina
- 作者F. Müller; A.-D. Müller; S. Schulze; M. Hietschold
- 卷第39卷
- 期第9期
- 印刷ISSN0022-2461
- 电子ISSN1573-4803
- 文件大小155.38KB
- 发表时间2004-05-1
- DOI10.1023/b:jmsc.0000025858.30792.bf
- 页码3199-3200
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