![SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Birefringent laterally sheared beam splitter-Savart polariscope]()
SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Birefringent laterally sheared beam splitter-Savart polariscopeZhang, Chunmin; Hou, Xun; Yuan, Jiahu; Zhao, Baochang; Xiangli, Bin; Wyant, James C.; Wang, Hexin; Li, Yingcai; Peng, Zhihong; Han, Sen · 2005