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SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Physics and Applications of Optoelectronic Devices - <title>Internal efficiency analysis of 280-nm light emitting diodes</title>

SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Physics and Applications of Optoelectronic Devices - Internal efficiency analysis of 280-nm light emitting diodes

Piprek, Joachim; Moe, Craig G.; Keller, Sarah L.; Nakamura, Shuji; DenBaars, Steven P.; Piprek, Joachim
  • 作者Piprek, Joachim; Moe, Craig G.; Keller, Sarah L.; Nakamura, Shuji; DenBaars, Steven P.; Piprek, Joachim
  • 卷第5594卷
  • 印刷ISSN0277-786X
  • 文件大小117.77KB
  • 发表时间2004
  • DOI10.1117/12.567084
  • 页码177-184
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