Electrical characterization of ITO/CuPc/Al diodes using temperature dependent capacitance spectroscopy and I–V measurements
- 作者F.T. Reis; D. Mencaraglia; S. Ould Saad; I. Séguy; M. Oukachmih; P. Jolinat; P. Destruel
- 印刷ISSN0022-3093
- 文件大小306.34KB
- 发表时间2004
- DOI10.1016/j.jnoncrysol.2004.03.050
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