![Lenses for Electron Microscopy and Microanalysis: Shadowgraph Method of Determining Focal Properties and Aberration Coefficients]()
Lenses for Electron Microscopy and Microanalysis: Shadowgraph Method of Determining Focal Properties and Aberration CoefficientsRempfer, Gf; Fyfield, Ms; Griffith, Oh · Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada · 1998