[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - Characterization of charge-pump rectifiers for standard submicron CMOS processes
Hooper, M.; Kucic, M.; Hasler, P.
- 作者Hooper, M.; Kucic, M.; Hasler, P.
- 文件大小396.52KB
- 发表时间2004
- DOI10.1109/ISCAS.2004.1329970