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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Hierarchical thermal modeling for SOI technology

[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Hierarchical thermal modeling for SOI technology

Xiu, K.; Ketchen, M.

作者Xiu, K.; Ketchen, M.
文件大小588.56KB
发表时间2004
DOI10.1109/stherm.2004.1291294
页码10-17

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