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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Stability of PEEC models with respect to partial element accuracy

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Stability of PEEC models with respect to partial element accuracy

Ekman, J.; Antonini, G.; Orlandi, A.; Ruehli, A.E.

作者Ekman, J.; Antonini, G.; Orlandi, A.; Ruehli, A.E.
卷第1卷
文件大小439.98KB
发表时间2004
DOI10.1109/ISEMC.2004.1350039
页码271-276

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