发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - BIST technique by equally spaced test vector sequences

[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - BIST technique by equally spaced test vector sequences

Manich, S.; Garcia, L.; Balado, L.; Lupon, E.; Rius, J.; Rodriguez, R.; Figueras, J.
  • 作者Manich, S.; Garcia, L.; Balado, L.; Lupon, E.; Rius, J.; Rodriguez, R.; Figueras, J.
  • 文件大小1379.86KB
  • 发表时间2004
  • DOI10.1109/VTEST.2004.1299245
  • 页码206-211
同期刊推荐
← 返回【学霸图书馆】主页
© 2026 学霸图书馆 · 让阅读成为习惯