[IEEE IEEE Compound Semiconductor Integrated Circuit Symposium. 2004 IEEE CISC Symposium - Monterey, CA, USA (24-27 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - A high reliability GaN HEMT with SiN passivation by Cat-CVD
Kunii, T.; Totsuka, M.; Kamo, Y.; Yamamoto, Y.; Takeuchi, H.; Shimada, Y.; Shiga, T.; Minami, H.; Kitano, T.; Miyakuni, S.; Nakatsuka, S.; Inoue, A.; Oku, T.; Nanjo, T.; Oishi, T.; Ishikawa, T.; Matsuda, Y.
- 作者Kunii, T.; Totsuka, M.; Kamo, Y.; Yamamoto, Y.; Takeuchi, H.; Shimada, Y.; Shiga, T.; Minami, H.; Kitano, T.; Miyakuni, S.; Nakatsuka, S.; Inoue, A.; Oku, T.; Nanjo, T.; Oishi, T.; Ishikawa, T.; Matsuda, Y.
- 文件大小213.51KB
- 发表时间2004
- DOI10.1109/csics.2004.1392535
- 页码197-200