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[IEEE Technical Digest of the 17th International Vacuum Nanoelectronics Conference - Cambridge, MA, USA (11-16 July 2004)] Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) - Ultra-high electron emission efficiency from defect controlled polyimide tunnel cathode

[IEEE Technical Digest of the 17th International Vacuum Nanoelectronics Conference - Cambridge, MA, USA (11-16 July 2004)] Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) - Ultra-high electron emission efficiency from defect controlled polyimide tunnel cathode

Baba, A.; Yoshida, T.; Asano, T.
  • 作者Baba, A.; Yoshida, T.; Asano, T.
  • 文件大小119.18KB
  • 发表时间2004
  • DOI10.1109/ivnc.2004.1354921
  • 页码104-105
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