[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application
Galateanu, L.; Bazu, M.; Ilian, V.; Tibeica, C.; Petu, A.; Apostol, D.; Damian, V.
- 作者Galateanu, L.; Bazu, M.; Ilian, V.; Tibeica, C.; Petu, A.; Apostol, D.; Damian, V.
- 卷第2卷
- 文件大小349.56KB
- 发表时间2004
- DOI10.1109/smicnd.2004.1402999
- 页码299-302