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[IEEE The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004. - Boulder, CO, USA (Oct. 17-20, 2004)] The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004. - Development of a measurement technique for high frequency characterization of insulation materials

[IEEE The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004. - Boulder, CO, USA (Oct. 17-20, 2004)] The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004. - Development of a measurement technique for high frequency characterization of insulation materials

Mugala, G.; Pettesson, P.; Eriksson, R.
  • 作者Mugala, G.; Pettesson, P.; Eriksson, R.
  • 文件大小172.76KB
  • 发表时间2004
  • DOI10.1109/ceidp.2004.1364225
  • 页码206-209
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