X-ray characterization of Si microstructures with high spatial resolution
- 期刊名称Journal of Applied Physics
- 作者Cedola, A.
- 卷第95卷
- 期第4期
- 印刷ISSN0021-8979
- 文件大小336.90KB
- 发表时间2004
- DOI10.1063/1.1635652
同期刊推荐
Thermal properties of time machinesGonzález-Díaz, Pedro F. · Physical Review D · 2012
extension of the standard modelBasso, Lorenzo; Moretti, Stefano; Pruna, Giovanni Marco · Physical Review D · 2010
limitMilekhin, A. · Physical Review D · 2012
Minkowski vacuum stress tensor fluctuationsFord, L. H.; Roman, Thomas A. · Physical Review D · 2005
Fluctuations of the Hawking fluxWu, C.-H.; Ford, L. H. · Physical Review D · 1999
Nonstatic Schwarzschild Model of a StarRoss, James A. · Physical Review D · 1973
cosmologiesMeyer, Sven; Pace, Francesco; Bartelmann, Matthias · Physical Review D · 2012
Attractors, universality, and inflationDownes, Sean; Dutta, Bhaskar; Sinha, Kuver · Physical Review D · 2012