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Microwave Electronics (Measurement and Materials Characterization) || Reflection Methods

Microwave Electronics (Measurement and Materials Characterization) || Reflection Methods

Chen, L. F.; Ong, C. K.; Neo, C. P.; Varadan, V. V.; Varadan, V. K.

作者Chen, L. F.; Ong, C. K.; Neo, C. P.; Varadan, V. V.; Varadan, V. K.
文件大小563.12KB
发表时间2004
DOI10.1002/0470020466.ch3
页码142-174

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