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Materials Challenges for CMOS Junctions

Materials Challenges for CMOS Junctions

Taylor, William J.; Rendon, Michael J.; Verret, Eric; Jiang, Jack; Capasso, Cristiano; Sing, Dave; Nguyen, Jen-Yee; Smith, James; Luckowski, Eric; Martinez, Arturo; Schaeffer, Jamie; Tobin, Phil
  • 期刊名称MRS Proceedings
  • 作者Taylor, William J.; Rendon, Michael J.; Verret, Eric; Jiang, Jack; Capasso, Cristiano; Sing, Dave; Nguyen, Jen-Yee; Smith, James; Luckowski, Eric; Martinez, Arturo; Schaeffer, Jamie; Tobin, Phil
  • 卷第810卷
  • 电子ISSN1946-4274
  • 文件大小1430.25KB
  • 发表时间2004-1
  • DOI10.1557/PROC-810-C1.1
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