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Dielectric spectroscopy during extrusion processing of polymer nanocomposites: a high throughput processing/characterization method to measure layered silicate content and exfoliation

Dielectric spectroscopy during extrusion processing of polymer nanocomposites: a high throughput processing/characterization method to measure layered silicate content and exfoliation

Rick D. Davis; Anthony J. Bur; Michael McBrearty; Yu-Hsin Lee; Jeffrey W. Gilman; Paul R. Start
  • 作者Rick D. Davis; Anthony J. Bur; Michael McBrearty; Yu-Hsin Lee; Jeffrey W. Gilman; Paul R. Start
  • 卷第45卷
  • 期第19期
  • 印刷ISSN0032-3861
  • 文件大小324.98KB
  • 发表时间2004
  • DOI10.1016/j.polymer.2004.07.047
  • 页码6487-6493
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