Dielectric spectroscopy during extrusion processing of polymer nanocomposites: a high throughput processing/characterization method to measure layered silicate content and exfoliation
Rick D. Davis; Anthony J. Bur; Michael McBrearty; Yu-Hsin Lee; Jeffrey W. Gilman; Paul R. Start
- 作者Rick D. Davis; Anthony J. Bur; Michael McBrearty; Yu-Hsin Lee; Jeffrey W. Gilman; Paul R. Start
- 卷第45卷
- 期第19期
- 印刷ISSN0032-3861
- 文件大小324.98KB
- 发表时间2004
- DOI10.1016/j.polymer.2004.07.047
- 页码6487-6493