The Stress Driven Rearrangement Instabilities in Electronic Materials and in Helium Crystals
- 期刊名称MRS Proceedings
- 作者Grinfeld, Michael; Grinfeld, Pavel; Kojima, Haruo; Little, John; Masutomi, Ryuichi; Persson, Per-Olof.; Zheleva, Tsvetanka
- 卷第849卷
- 电子ISSN1946-4274
- 文件大小326.02KB
- 发表时间2004-1
- DOI10.1557/proc-849-kk4.5
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