SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 12 April 2004)] Polarization: Measurement, Analysis, and Remote Sensing VI - Scattering and emission polarization simulation for simple objects
- 作者An, Changhyuk; Goldstein, Dennis H.; Chenault, David B.; Zeringue, Kyle J.
- 卷第5432卷
- 印刷ISSN0277-786X
- 文件大小173.52KB
- 发表时间2004
- DOI10.1117/12.543492
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