SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Sensors for Harsh Environments - Sensor integration in radioactive environments
- 作者Harfensteller, Mark; Wang, Anbo; Schilp, Michael; Eursch, Andreas; Zaeh, Michael F.
- 卷第5590卷
- 印刷ISSN0277-786X
- 文件大小323.68KB
- 发表时间2004
- DOI10.1117/12.571419
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