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Measurement of attraction force between AFM tip and surface of dielectric thin films with DC-bias

Measurement of attraction force between AFM tip and surface of dielectric thin films with DC-bias

Y.F. Zhu; C.H. Xu; B. Wang; C.H. Woo

作者Y.F. Zhu; C.H. Xu; B. Wang; C.H. Woo
卷第33卷
印刷ISSN0927-0256
文件大小137.78KB
发表时间2005
DOI10.1016/j.commatsci.2004.12.033

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