[IEEE Conference on Electron Devices, 2005 Spanish - Tarragona, Spain (2-4 Feb. 2005)] Conference on Electron Devices, 2005 Spanish - Comparative evaluation of high current SiC schottky diodes and Si PN junction diodes
- 作者Jorda, X.; Tournier, D.; Vellvehi, M.; Perez, A.; Perez, R.; Godignon, P.; Millan, J.
- 文件大小671.20KB
- 发表时间2005
- DOI10.1109/SCED.2005.1504315
- 页码87-90