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[IEEE Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement - Niagara Falls, Ont., Canada (2005.05.13-2005.05.13)] Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement - A two-stage Monte Carlo approach to the expression of uncertainty with finite sample sizes

[IEEE Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement - Niagara Falls, Ont., Canada (2005.05.13-2005.05.13)] Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement - A two-stage Monte Carlo approach to the expression of uncertainty with finite sample sizes

Crowder, S.V.; Moyer, R.D.
  • 作者Crowder, S.V.; Moyer, R.D.
  • 文件大小117.73KB
  • 发表时间2005
  • DOI10.1109/amuem.2005.1594604
  • 页码52-56
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