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Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure

Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure

John Walton; Neal Fairley

作者John Walton; Neal Fairley
卷第148卷
期第1期
印刷ISSN0368-2048
文件大小1008.31KB
发表时间2005
DOI10.1016/j.elspec.2005.02.003
页码29-40

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