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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Segmented Addressable Scan Architecture

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Segmented Addressable Scan Architecture

Al-Yamani, A.; Chmelar, E.; Grinchuck, M.

作者Al-Yamani, A.; Chmelar, E.; Grinchuck, M.
文件大小138.51KB
发表时间2005
DOI10.1109/vts.2005.74
页码405-411

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