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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Constructive Derivation of Analog Specification Test Criteria

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Constructive Derivation of Analog Specification Test Criteria

Stratigopoulos, H.-G.D.; Makris, Y.

作者Stratigopoulos, H.-G.D.; Makris, Y.
文件大小233.59KB
发表时间2005
DOI10.1109/vts.2005.36
页码395-400

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