Numerical investigation of ultrashort laser damage in semiconductors
- 作者J.K. Chen; D.Y. Tzou; J.E. Beraun
- 卷第48卷
- 印刷ISSN0017-9310
- 文件大小375.66KB
- 发表时间2005
- DOI10.1016/j.ijheatmasstransfer.2004.09.015
- 页码501-509
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