New trim configurations for laser trimmed thick-film resistors—theoretical analysis, numerical simulation and experimental verification

• 作者Marek Wroński; Sławomir Kamiński; Edward Miś; Andrzej Dziedzic
• 卷第45卷
• 期第12期
• 印刷ISSN0026-2714
• 文件大小251.02KB
• 发表时间2005
• DOI10.1016/j.microrel.2005.03.006
• 页码1941-1948