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[IEEE ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 - Shanghai, China (18-21 Jan. 2005)] Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. - An improved test access mechanism structure and optimization technique in system-on-chip

[IEEE ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 - Shanghai, China (18-21 Jan. 2005)] Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. - An improved test access mechanism structure and optimization technique in system-on-chip

Feng Jianhua, ; Long Jieyi, ; Xu Wenhua, ; Ye Hongfei,

作者Feng Jianhua, ; Long Jieyi, ; Xu Wenhua, ; Ye Hongfei,
卷第2卷
文件大小372.41KB
发表时间2005
DOI10.1109/aspdac.2005.1466609

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