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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Effective TARO Pattern Generation

[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Effective TARO Pattern Generation

Intaik Park, ; Al-Yamani, A.; McCluskey, E.J.

作者Intaik Park, ; Al-Yamani, A.; McCluskey, E.J.
文件大小144.30KB
发表时间2005
DOI10.1109/VTS.2005.43
页码161-166

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