The effect of highly ionising particles on the CMS silicon strip tracker
- 作者W. Adam; T. Bergauer; M. Friedl; R. Fruehwirth; J. Hrubec; M. Krammer; M. Pernicka; W. Waltenberger; W. Beaumont; E. de Langhe; E. de Wolf; M. Tasevsky; O. Bouhali; B. Clerbaux; G. de Lentdecker; J.-P. Dewulf; L. Neuckermans; C. Vander-Velde; P. Vanlaer; J. Wickens; J. D’Hondt; R. Goorens; J. Heyninck; S. Lowette; S. Tavernier; L. Van Lancker; C. Yu; S. Assouak; J.-L. Bonnet; G. Bruno; B. De-Callatay; J. De-Favereau-de-Jeneret; C. Delaere; S. De-Visscher; D. Favart; G. Gregoire; Th. Keutgen; G. Leibenguth; V. Lemaitre; D. Michotte; O. Militaru; A. Ninane; S. Ovyn; K. Piotrzkowski; V. Roberfroid; X. Rouby; O. Van-der-Aa; M. Vander-Donckt; I. Boulogne; E. Daubie; F. Defontaines; P. Herquet; S. Czellar; J. Härkönen; V. Karimäki; H. Katajisto; T. Linden; P. Luukka; T. Lampen; T. Mäenpää; E. Tuominen; J. Tuominiemi; T. Tuuva; M. Ageron; E. Chabanat; D. Contardo; N. Estre; R. Haroutunian; N. Lumb; L. Mirabito; S. Perries; B. Trocme; R. Blaes; F. Charles; F. Drouhin; J.P. Ernenwein; J.C. Fontaine; J.D. Berst; J.M. Brom; F. Didierjean; U. Goerlach; L. Gross; P. Juillot; A. Lounis; C. Maazouzi; C. Olivetto; R. Strub; P. Vanhove; D. Vintache; R. Adolphi; R. Brauer; W. Braunschweig; H. Esser; L. Feld; A. Heister; W. Karpinski; K. Klein; S. König; C. Kukulies; J. Olzem; A. Ostaptchouk; D. Pandoulas; G. Pierschel; F. Raupach; S. Schael; A. Schultz von Dratzig; G. Schwering; R. Siedling; M. Thomas; M. Wlochal; F. Beissel; K.-D. Boffin; M. Duda; A. Flossdorf; G. Flugge; T. Franke; K. Hangarter; B. Hegner; Th. Hermanns; S. Kasselmann; Th. Kress; A. Linn; J. Mnich; A. Nowack; M. Poettgens; O. Pooth; B. Reinhold; M. Bleyl; U. Holm; R. Klanner; U. Pein; P. Schleper; N. Schirm; G. Steinbrück; M. Stoye; S. Tesch; R. van Staa; K. Wick; B. Atz; T. Barvich; P. Blum; W. de Boer; F. Boegelspacher; G. Dirkes; M. Fahrer; J. Fernandez; M. Frey; A. Furgeri; E. Grigoriev; F. Hartmann; S. Heier; T. Muller; T. Ortega-Gomez; H.-J. Simonis; P. Steck; A. Theel; T. Weiler; V. Zhukov; D. Creanza; N. De
- 卷第543卷
- 印刷ISSN0168-9002
- 文件大小759.14KB
- 发表时间2005
- DOI10.1016/j.nima.2004.11.049
- 页码463-482
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