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[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size

[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - State-reuse Test Generation for Progressive Random Access Scan: Solution to Test Power, Application Time and Data Size

Dong Hyun Baik, ; Saluja, K.K.

作者Dong Hyun Baik, ; Saluja, K.K.
文件大小273.96KB
发表时间2005
DOI10.1109/ats.2005.101
页码272-277

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