[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - Thermal characterization of a radial micro-channel cooling plate
Bognar, Gy.; Horvath, Gy.; Kohari, Zs.; Pang, A.J.; Desmulliez, M.P.Y.; Poppe, A.; Rencz, M.; Szekely, V.
- 作者Bognar, Gy.; Horvath, Gy.; Kohari, Zs.; Pang, A.J.; Desmulliez, M.P.Y.; Poppe, A.; Rencz, M.; Szekely, V.
- 文件大小1286.30KB
- 发表时间2005
- DOI10.1109/stherm.2005.1412169
- 页码135-140