[IEEE Twenty-Second National Radio Science Conference, 2005. NRSC 2005 - Cairo, Egypt (2005.03.15-2005.03.17)] Proceedings of the Twenty-Second National Radio Science Conference, 2005. NRSC 2005. - A model to predict the degradation of silicon dioxide films in mos structures
- 作者Samanta, P.; Sarkar, C.K.
- 文件大小580.32KB
- 发表时间2005
- DOI10.1109/nrsc.2005.193981
- 页码11-16
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