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[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - CMOS devices strained-silicon technology

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - CMOS devices strained-silicon technology

Yee-Chia Yeo, ; Wang, H.C.-H.

作者Yee-Chia Yeo, ; Wang, H.C.-H.
文件大小115.80KB
发表时间2005
DOI10.1109/iedm.2005.1609387
页码488-488

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