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[IEEE Second International Conference on Embedded Software and Systems (ICESS'05) - Xian, China (16-18 Dec. 2005)] Second International Conference on Embedded Software and Systems (ICESS'05) - Test Case Generation Based on Time Constraints

[IEEE Second International Conference on Embedded Software and Systems (ICESS'05) - Xian, China (16-18 Dec. 2005)] Second International Conference on Embedded Software and Systems (ICESS'05) - Test Case Generation Based on Time Constraints

Ana Cavalli, Elisangela Rodrigues Vieira

作者Ana Cavalli, Elisangela Rodrigues Vieira
文件大小589.46KB
发表时间2005
DOI10.1109/icess.2005.89
页码223-230

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